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作者:
Joseph Glaz, Vladimir Pozdnyakov, Sylvan Wallenstein, editors.
ISBN:
9780817647483
出版年代:
2009
出版社:
Birkhäuser
文件大小:
0 KB

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Scan statistics is currently one of the most active and important areas of research in applied probability and statistics, having applications to a wide variety of fields: archaeology, astronomy, bioinformatics, biosurveillance, molecular biology, genetics, computer science, electrical engineering, geography, material sciences, physics, reconnaissance, reliability and quality control, telecommunication, and epidemiology. Filling a gap in the literature, this self-contained volume brings together a collection of selected chapters illustrating the depth and diversity of theory, methods and applications in the area of scan statistics.
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